System and method for the automated testing and/or measuring of a plurality of substantially identical components by X-radiation
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United States of America Patent
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Nov 8, 2016
Grant Date -
Nov 19, 2015
app pub date -
Dec 18, 2013
filing date -
Dec 24, 2012
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Abstract
A system for the automated serial testing and/or measuring of a plurality of substantially identical components by X-radiation, the system comprising a testing device with a support, a rotor mounted so as to be continuously rotatable on the support, and an X-ray device disposed on the rotor, a protective enclosure surrounding the testing device, a handling device for handling a component during X-ray testing, and a control/evaluation unit configured for automatically controlling the system as well as evaluating the X-ray signals by computer tomography. The handling device is configured for periodically reciprocating between a loading region and a testing region and comprises an end face element on which the component can be disposed on the side of the end face.
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