System and method for the automated testing and/or measuring of a plurality of substantially identical components by X-radiation
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United States of America Patent
Stats
-
Nov 8, 2016
Grant Date -
Nov 19, 2015
app pub date -
Dec 18, 2013
filing date -
Dec 24, 2012
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A system for the automated serial testing and/or measuring of a plurality of substantially identical components by X-radiation, the system comprising a testing device with a support, a rotor mounted so as to be continuously rotatable on the support, and an X-ray device disposed on the rotor, a protective enclosure surrounding the testing device, a handling device for handling a component during X-ray testing, and a control/evaluation unit configured for automatically controlling the system as well as evaluating the X-ray signals by computer tomography. The handling device is configured for periodically reciprocating between a loading region and a testing region and comprises an end face element on which the component can be disposed on the side of the end face.
First Claim
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International Classification(s)
Cited Art Landscape
Patent Citation Ranking
- 6 Citation Count
- G01N Class
- 31.44 % this patent is cited more than
- 9 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | May 8, 2028 |
