Method and system for identifying rare-event failure rates
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United States of America Patent
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Nov 1, 2016
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app pub date -
Oct 27, 2011
filing date -
Oct 27, 2010
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Abstract
A method and system to estimate failure rates in designs. N Monte Carlo samples are drawn from the random distribution that describes process variation in the design. A subset of these samples is selected, and that subset of Ninit samples are simulated (with a circuit simulator) to measure a performance value for each sample. A model is constructed, using the values of the Ninit process points as training inputs, and the corresponding Ninit performance values as training outputs. The candidate Monte Carlo samples are from the N Monte Carlo samples that have not yet been simulated. Each candidate is simulated on the model to get predicted performance values, and the samples are ordered in ascending (or descending) order of the predicted performance values. Simulation of candidates samples is then begun, in that order. The sampling and simulation will stops once there is sufficient confidence that all failures are found.
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