Machine vision inspection systems and methods and aperture covers for use therewith
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United States of America Patent
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Oct 11, 2016
Grant Date -
Nov 13, 2014
app pub date -
May 10, 2013
filing date -
May 10, 2013
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Abstract
Machine vision inspection systems and methods for inspecting objects, such as objects with shiny surfaces, as well as illuminators with aperture covers for use therewith. Use of such an aperture cover eliminates the void (dark spot) in the illumination field that inherently results from the presence of an aperture through which an associated camera views an object to be inspected.
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