Semiconductor structures including molybdenum nitride, molybdenum oxynitride or molybdenum-based alloy material, and method of making such structures

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United States of America Patent

PATENT NO 9466660
APP PUB NO 20150102460A1
SERIAL NO

14055620

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A semiconductor structure may include a first electrode over a substrate, a high-K dielectric material over the first electrode, and a second electrode over the high-K dielectric material, wherein at least one of the first electrode and the second electrode may include a material selected from the group consisting of a molybdenum nitride (MoaNb) material, a molybdenum oxynitride (MoOxNy) material, a molybdenum oxide (MoOx) material, and a molybdenum-based alloy material comprising molybdenum and nitrogen.

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Patent Owner(s)

  • MICRON TECHNOLOGY, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Antonov, Vassil Boise, US 25 119
Bhat, Vishwanath Boise, US 78 1447
Reddy, Kotha Sai Madhukar Boise, US 2 8
Rocklein, Matthew N Boise, US 41 240

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