On-chip test technique for low drop-out regulators
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United States of America Patent
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Oct 11, 2016
Grant Date -
Dec 31, 2015
app pub date -
Sep 3, 2015
filing date -
Apr 6, 2012
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Abstract
A circuit and method is described for automatically testing multiple LDO regulator circuits on an integrated circuit chip independent of an ATE. Each LDO regulator is tested for voltage at a specified current output capability, wherein the output driver transistor is formed by at least two pass transistors, which are each tested for voltage output at a particular current capability. The test results are delivered back to the ATE and for a failed test, the gate voltage of the pass device can be observed through an analog multiplexer to enable debug.
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