Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test

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United States of America Patent

PATENT NO 9459978
APP PUB NO 20140208160A1
SERIAL NO

13749199

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Abstract

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A segmented subsystem, for use within an automated test platform, includes a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment. A second subsystem segment includes a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.

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Patent Owner(s)

Patent OwnerAddress
DEUTSCHE BANK AG NEW YORK BRANCH AS COLLATERAL AGENT60 WALL STREET NEW YORK NY 10005

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Alton, Timothy Gilroy, US 6 66
Amy, Michael E Danville, US 4 70
Fritzsche, William A Morgan Hill, US 14 116
Jula, James Michael Portland, US 1 9
Poffenberger, Russell Elliott Discovery Bay, US 5 56

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Patent Citation Ranking

  • 4 Citation Count
  • G06F Class
  • 11.69 % this patent is cited more than
  • 9 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges3122144564193188710466053822701961379632401 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +010002000300040005000600070008000900010000110001200013000140001500016000

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11.5 Year Payment $7400.00 $3700.00 $1850.00 Apr 4, 2028