Automated test platform utilizing segmented data sequencers to provide time controlled test sequences to device under test

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United States of America Patent

PATENT NO 9459978
APP PUB NO 20140208160A1
SERIAL NO

13749199

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Abstract

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A segmented subsystem, for use within an automated test platform, includes a first subsystem segment including a first data sequencer configured to coordinate the execution of one or more instructions within the first subsystem segment. A second subsystem segment includes a second data sequencer configured to coordinate the execution of one or more instructions within the second subsystem segment.

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Patent Owner(s)

Patent OwnerAddress
DEUTSCHE BANK AG NEW YORK BRANCH AS COLLATERAL AGENT60 WALL STREET NEW YORK NY 10005

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Alton, Timothy Gilroy, US 6 66
Amy, Michael E Danville, US 4 70
Fritzsche, William A Morgan Hill, US 14 116
Jula, James Michael Portland, US 1 9
Poffenberger, Russell Elliott Discovery Bay, US 5 56

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