Large-area probe card and method of manufacturing the same
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United States of America Patent
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Oct 4, 2016
Grant Date -
Feb 26, 2015
app pub date -
Aug 19, 2014
filing date -
Aug 26, 2013
priority date (Note) -
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Abstract
A large-area probe card and method of manufacturing the same including an insulation plate including at least one contactor formed thereon, a main substrate disposed below the insulation plate, and a flexible signal connector vertically passing through the insulation plate and disposed between the at least one contactor and the main substrate to electrically connect the at least one contactor with the main substrate.
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