Contact test device
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United States of America Patent
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Oct 4, 2016
Grant Date -
Oct 3, 2013
app pub date -
Nov 16, 2011
filing date -
Nov 29, 2010
priority date (Note) -
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Abstract
A probe is fitted into cylindrical retaining holes formed in an upper block and a lower block. A plunger of the probe has a plate-like guide portion, and an edge contact portion. A bottomed one of the cylindrical retaining holes is formed in the upper block from a lower part thereof and a guide groove is formed from an upper surface thereof. The plate-like guide portion is movably guided vertically while being prevented from turning and slipping out by the guide groove.
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