Temperature control chamber for compact X-ray machine
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United States of America Patent
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Oct 4, 2016
Grant Date -
Mar 12, 2015
app pub date -
Sep 10, 2014
filing date -
Sep 11, 2013
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Abstract
A sample temperature control chamber is described for a benchtop X-ray machine and/or full-protection X-ray machine, which comprises (a) a first chamber part (11) and a second chamber part (12) which can be connected together and are configured so as to form a closed chamber, (b) a sample holder, (c) an integrated temperature control device for controlling the temperature of a sample (P) which is provided on the sample holder, and (d) an active cooling system for dissipating heat from the sample temperature control chamber, the active cooling system comprising a heat sink and/or a fan. A system for X-ray-based analysis of a sample, in particular for X-ray diffraction measurements, is also described.
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