System and apparatus for measurement of light scattering from a sample
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United States of America Patent
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Oct 4, 2016
Grant Date -
Nov 7, 2013
app pub date -
May 1, 2013
filing date -
May 2, 2012
priority date (Note) -
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Abstract
An apparatus and method for providing a solution that enables technicians or other technical professionals to obtain accurate gloss, haze and DOI values for a reflecting sample due to the surface conditions of the sample. The apparatus and method allow for the generation of a data model of the surface of a sample using a sensor array designed to detect the divergence of a collimated beam of light reflected off the surface of the sample. The same principle enables technical professionals to obtain accurate haze and clarity values for a transparent or translucent sample that is trans-illuminated by light.
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