Method and apparatus to detect LO leakage and image rejection using a single transistor
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 20, 2016
Issued Date -
N/A
app pub date -
Aug 25, 2014
filing date -
Aug 25, 2014
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
LO leakage and Image are common and undesirable effects in typical transmitters. Typically, thirty complex hardware and algorithms are used to calibrate and reduce these two impairments. A single transistor that draws essentially no de current and occupies a very small area, is used to detect the LO leakage and Image Rejection signals. The single transistor operating as a square law device, is used to mix the signals at the input and output ports of the power amplifier (PA). The mixed signal generated by the single transistor enables the simultaneous calibration of the LO leakage and Image Rejection.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully