Sensor circuit for detecting the setting of an integrated circuit
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United States of America Patent
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Sep 6, 2016
Grant Date -
Feb 6, 2014
app pub date -
Oct 14, 2013
filing date -
Dec 16, 2008
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Abstract
Methods and apparatus selecting settings for circuits according to various aspects of the present invention may operate in conjunction with a measurement element connected to the circuit. The circuit may include a voltage source adapted to supply a voltage to the measurement element. The voltage may be substantially independent of the characteristics of the measurement element. The circuit may further include a measurement sensor responsive to a current in the measurement element. The measurement sensor may generate a control signal according to the current in the measurement element.
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