Method of reconstructing electrical probes
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Sep 6, 2016
Grant Date -
Nov 27, 2014
app pub date -
May 23, 2013
filing date -
May 23, 2013
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A probe, comprising: a shank region having a top surface integrally connected to a bottom surface of a conical region; a pyramidal tip region having a base surface integrally connected to a top surface of the conical region; and wherein the base surface of the pyramidal tip region is contained within a perimeter of the top surface of the conical region. Also a method of fabricating the probe and a method of probing devices under test.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully