Method and apparatus for nondestructive measuring of a coating thickness on a curved surface
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Aug 30, 2016
Grant Date -
Jun 5, 2014
app pub date -
Nov 4, 2013
filing date -
Sep 2, 2009
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An improved method and apparatus for non-destructive measurements of coating thicknesses on a curved surface by measuring components of the microwave energy reflected from the surface. Preferred embodiments of the present invention provide a portable microwave thickness detector with a rounded rocker-type base allowing the microwave beam to be moved through a range of angles with respect to the target surface. An optical alignment system determines when the microwave angle of incidence is at a desired angle when the components of the reflected microwave energy are measured. Preferred embodiments of the present invention also provide a portable microwave thickness detector which maintains a constant standoff distance between the between the microwave detector and the sample to be measured.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully