X-ray theodolite

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United States of America Patent

PATENT NO 9417060
SERIAL NO

14331764

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Abstract

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Methods and apparatus for determining the distance to a specified point or distances between specified points on one or more objects, where the specified points are obscured behind an opaque barrier and cannot be viewed. Specified points are illuminated with penetrating radiation from two or more successive locations, and scattered radiation from the specified points is detected, and distance is calculated based on illumination angles. The apparatus has a source of penetrating radiation, a beam scanner for directing the penetrating radiation, a detector for detecting scattered radiation, and a processor for calculating the distance.

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Patent Owner(s)

Patent OwnerAddress
AMERICAN SCIENCE AND ENGINEERING INC829 MIDDLESEX TURNPIKE BILLERICA MA 01821

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Schubert, Jeffrey R Somerville, US 18 682

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