Test pin array with electrostatic discharge protection

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United States of America Patent

PATENT NO 9408284
APP PUB NO 20140204500A1
SERIAL NO

14238847

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Abstract

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A test pin array (21) array with electrostatic discharge protection comprises at least one modified test pin (22) with a static dissipative element (24) incorporated at its plunger tip (23). The use of the modified test among the test pin array provides an extremely low-cost alternative solution to the large scale testing of microchips without the use of any air ionizer.

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Patent Owner(s)

Patent OwnerAddress
ESD TECHNOLOGY CONSULTING & LICENSING CO LTDSHENZHEN GUANGDONG 518031

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kow, Kek Hing Guangdong, CN 8 8

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