Sacrificial waveguide test structures
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 19, 2016
Grant Date -
May 28, 2015
app pub date -
Dec 8, 2014
filing date -
Apr 1, 2009
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Sacrificial optical test structures are constructed upon a wafer of pre-cleaved optical chips for testing the optical functions of the pre-cleaved optical chips. The sacrificial optical structures are disabled upon the cleaving the optical chips from the wafer and the cleaved optical chips can be used for their desired end functions. The test structures may remain on the cleaved optical chips or they may be discarded.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully