Automated atomic force microscope and the operation thereof
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 5, 2016
Grant Date -
Oct 22, 2015
app pub date -
Apr 21, 2015
filing date -
Apr 21, 2014
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Improvements for rapidly calibrating and automatically operating a scanning probe microscope are disclosed. A central component of the SPM is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized, resulting in high-throughput, repeatable and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, avoiding tip or sample damage from the beginning of the measurement process.
First Claim
Other Claims data not available
Family
International Classification(s)
- 2015 Application Filing Year
- G01Q Class
- 101 Applications Filed
- 89 Patents Issued To-Date
- 88.12 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01Q Class
- 0 % this patent is cited more than
- 9 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jan 5, 2028 |
