Optical beam positioning unit for atomic force microscope
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United States of America Patent
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Jul 5, 2016
Grant Date -
Oct 23, 2014
app pub date -
Mar 12, 2014
filing date -
Mar 14, 2013
priority date (Note) -
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Abstract
This invention relates to an optical light beam positioning system that enables the combination of two or more light beams of different wavelengths to be focused onto a probe or sample of a scientific instrument, such as an atomic force microscope, for a number of specific uses typical to AFMs, like measuring the deflection or oscillation of the probe and illuminating an object for optical imaging, and less traditional ones like photothermal excitation of the probe, photothermal activated changes in the sample, photothermal cleaning of the probe and photochemical, photovoltaic, photothermal and other light beam induced changes in the sample. The focused light beams may be independently positioned relative to each other.
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