Laboratory X-ray micro-tomography system with crystallographic grain orientation mapping capabilities
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 5, 2016
Grant Date -
Nov 5, 2015
app pub date -
Jul 13, 2015
filing date -
Oct 18, 2012
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method and system for three dimensional crystallographic grain orientation mapping illuminates a polycrystalline sample with a broadband x-ray beam derived from a laboratory x-ray source, detects, on one or more x-ray detectors, diffracted beams from the sample, and processes data from said diffracted beams with the sample in different rotation positions to generate three dimensional reconstructions of grain orientation, position, and/or 3-D volume. A specific, cone beam, geometry leverages the fact that for a point x-ray source with a divergent beam on reflection of an extended crystal grain diffracts x-rays such that they are focused in the diffraction plane direction.
First Claim
Other Claims data not available
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01N Class
- 31.44 % this patent is cited more than
- 9 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jan 5, 2028 |
