System for simultaneously determining memory test result
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United States of America Patent
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Jun 28, 2016
Grant Date -
Feb 5, 2015
app pub date -
Jul 30, 2014
filing date -
Jul 31, 2013
priority date (Note) -
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Abstract
A system for test plural memories simultaneously includes a pattern generation part which generates a pattern signal for testing and transmits the signal to the memories, a delay part which receives data through a first data line from a first memory device that is disposed in a closest position from the delay part and a second data line from a second memory device that is disposed in a farthest position from the delay part, and a determination part which determines the result of testing by comparing the data from the first memory device and the second memory device. The delay part output the first data and the second data to the determination part simultaneously.
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