IR microscope with image field curvature compensation, in particular with additional illumination optimization
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United States of America Patent
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Jun 28, 2016
Grant Date -
Jul 25, 2013
app pub date -
Jan 17, 2013
filing date -
Jan 20, 2012
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Abstract
An IR microscope (1) is constituted such that, in an optical viewing mode in a beam path of visible light (VIS-R, VIS-T), a first intermediate focus (ZW1) is imaged onto a flat detector surface (15a) of a camera. The IR microscope (1) is constituted such that, in the beam path of the visible light (VIS-R, VIS-T), the first intermediate focus (ZW1) is imaged onto a second intermediate focus (ZW2), and, in the second intermediate focus (ZW2), a Mangin mirror (11) is disposed that corrects a field curvature of the Cassegrain objective (4). The invention provides an IR microscope in which the field curvature generated by the Cassegrain objective is corrected in a simple manner in the optical viewing mode when detection is performed using a flat detector and without restricting the spectral range of the IR microscope.
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