Scan test circuit with pulse generator for generating differential pulses to clock functional path
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 21, 2016
Grant Date -
Feb 26, 2015
app pub date -
Oct 30, 2014
filing date -
Jul 25, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A scan test circuit includes: a pulse generator, for generating differential pulses according to a system clock signal; a functional path, including: a D-type latch clocked by the differential pulses; a test path, including: a scan latch clocked by a test clock signal; and a tri-state inverter. When a test enable signal is enabled, the generation of the differential pulses is disabled.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully