Determining changes in the x-ray emission yield of an x-ray source
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 14, 2016
Grant Date -
Aug 29, 2013
app pub date -
Nov 2, 2011
filing date -
Nov 8, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The present invention relates to determining changes in the X-ray emission yield of an X-ray tube, in particular determining dose degradation. In order to provide determination of such changes, an X-ray source is provided comprising a cathode, an anode; and at least one X-ray sensor (16). The cathode emits electrons towards the anode and the anode comprises a target area on which the electrons impinge, generating X-ray radiation. An X-ray barrier (24) is provided with an aperture (26) for forming an emitting X-ray beam from the X-ray radiation, wherein the emitting X-ray beam has a beam formation (30) with a central axis. The at least one X-ray sensor is arranged within the beam formation and measures the X-ray intensity for a specific direction of X-ray emission with an angle with respect to the central axis. The at least one X-ray sensor can be positioned inside the beam formation (30), but outside the “actual field of view” (40) as determined by a diaphragm (36).
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully