Manufacturing testing for LDPC codes

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United States of America Patent

PATENT NO 9368233
APP PUB NO 20150019926A1
SERIAL NO

14334532

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Abstract

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An amount of time and an error rate function are received, where the error rate function defines a relationship between a number of iterations associated with iterative decoding and an error rate. A testing error rate is determined based at least in part on the amount of time. The number of iterations which corresponds to the testing error rate in the error rate function is selected to be a testing number of iterations; the testing error rate and the testing number of iterations are associated with testing storage media using iterative decoding.

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Patent Owner(s)

Patent OwnerAddress
SK HYNIX MEMORY SOLUTIONS INCSAN JOSE CA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kou, Yu San Jose, US 60 289
Zeng, Lingqi San Jose, US 79 492

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