Method for determining a sampling time of a signal, device for determining the same, and method for determining a sampling parameter of a signal

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United States of America Patent

PATENT NO 9360503
APP PUB NO 20150042310A1
SERIAL NO

13961990

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Abstract

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A method for determining a sampling time of a signal, the method including: determining a candidate sampling time of a signal for input to a sampling circuit; determining a resultant sampling time at which the sampling circuit samples the signal when input with the candidate sampling time; and determining a sampling time of the signal based on a noise shaping of a difference between the resultant sampling time and the candidate sampling time.

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Patent Owner(s)

Patent OwnerAddress
INTEL CORPORATION2200 MISSION COLLEGE BOULEVARD SANTA CLARA CA 95054

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Gazsi, Lajos Duesseldorf, DE 35 374
Meier, Stefan Neubiberg, DE 51 386
Schoebinger, Matthias Munich, DE 10 22

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