Structured-light based measuring method and system
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 7, 2016
Grant Date -
Feb 28, 2013
app pub date -
May 7, 2010
filing date -
May 7, 2010
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A structured-light measuring method, includes: matching process, in which the number and the low-precision depth of a laser point are achieved by using the imaging position of the laser point on a first camera (21) according to a first corresponding relationship in a calibration database, and the imaging position of the laser point on a second camera (22) is searched according to the number and the low-precision depth of the laser point so as to acquire the candidate matching points, then the matching process is completed according to the imaging position of the first camera (21) and the candidate matching points of the imaging position of the first camera (21) on the second camera (22) so that a matching result is achieved; and computing process, in which the imaging position of the second camera (22) matching with the imaging position of the first camera (21) is achieved according to the matching result, and then the precision position of the laser point is determined by a second corresponding relationship in the calibration database. A structured-light measuring system utilizes the above measuring method.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully