Apparatus for materials testing of test objects using X-rays
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United States of America Patent
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May 17, 2016
Grant Date -
Feb 23, 2012
app pub date -
Jan 13, 2009
filing date -
Sep 24, 2008
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Abstract
An apparatus for materials testing of test objects using X-rays, the apparatus comprising an X-ray device, comprising: an X-ray source for irradiating a test object held in a test position; an X-ray linear diode array detector comprising at least two detection sections and configured to acquire a complete radial cross-section of the test object; and an electronic control device configured to control the X-ray device, wherein during X-ray testing the test object and the X-ray device are rotatable relative to each other only around an essentially vertical axis of rotation.
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