Multi-layered phase-change memory device

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United States of America Patent

PATENT NO 9337421
APP PUB NO 20130292631A1
SERIAL NO

13874411

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Abstract

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The present invention relates to a phase-change memory device structure and the materials used. The structure comprises a substrate, a single or multiple sandwich-memory-unit(s), a first electrode, and a second electrode. The sandwich-memory-unit contains an upper barrier layer, a lower barrier layer, and a memory layer therebetween. The thickness of the memory-layer is less than 30 nm. The present invention provides a phase-change memory device with a high Tc and a low volume changing rate during phase-change.

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Patent Owner(s)

Patent OwnerAddress
FENG CHIA UNIVERSITYNO 100 WENHUA RD XITUN DIST TAICHUNG CITY 40724

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Chih-Chung Nantou County, TW 55 209
Chin, Tsung-Shune Hsinchu County, TW 18 82
Chu, Yung-Ching Hsinchu County, TW 8 52

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