Apparatus and methods for locating source of and analyzing electromagnetic radiation

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United States of America Patent

PATENT NO 9335398
APP PUB NO 20150331082A1
SERIAL NO

14531247

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Abstract

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Method and apparatus for determining direction from which electromagnetic radiation originates and spectral characteristics of the radiation are provided. Lenses, diffraction gratings, which may be present on the surface of the lenses, and mirrors direct radiation to a photodetector. Lens and grating parameters, along with the location, size, relative spacing and orientation of diffracted orders of radiation detected by the photodetector are used for determining direction from which the radiation originates.

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Patent Owner(s)

Patent OwnerAddress
NANOHMICS INC6201 EAST OLTORF ST SUITE 400 AUSTIN TX 78741

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Mayo, Michael W Austin, US 4 79
Mitchell, Daniel R Austin, US 29 378
Savoy, Steve M Austin, US 18 144
Zollars, Byron G Georgetown, US 17 141

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