Method and apparatus for investigating the X-ray radiographic properties of samples
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United States of America Patent
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May 3, 2016
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Mar 12, 2012
filing date -
Mar 17, 2011
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Abstract
The invention relates to a method and an apparatus for studying the X-ray properties of samples (3c), wherein X-ray radiation scattered by a sample (3c) is recorded by a detector (5) positioned at a distance from the sample (3c) and is evaluated with respect to the characteristics of the sample. According to the invention, it is provided that at a predetermined distance between the X-ray beam source (1) and the detector (5) or between the starting point (2b) of the X-ray beam (10) directed at the sample (3c) and the detector (5), for a predetermined number of successive measurements the distance (S1, S2) between the sample (3c) and the detector (5) is changed and is set at a predetermined different value.
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