Wavelength-tunable laser apparatus having wavelength measuring function
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United States of America Patent
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Apr 26, 2016
Grant Date -
Jan 29, 2015
app pub date -
Nov 28, 2012
filing date -
Jan 13, 2012
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Abstract
The present invention relates to a wavelength-tunable laser apparatus which can measure a wavelength in a wavelength-tunable laser diode package structure for dense wavelength division multiplexing (DWDM) having a transistor outline (TO) type appearance. The wavelength-tunable laser apparatus of the present invention is a TO-can type wavelength-tunable laser apparatus comprising: a laser diode chip for emitting a laser beam; a collimator lens for collimating the laser beam; a wavelength-selective filter through which the selected wavelength passes; and a reflecting mirror having an inclined reflective surface, wherein the laser beam is split into a beam which is emitted from the laser diode chip (100), collimated by the collimator lens (200) and emitted through a 45-degree reflective mirror (300) to the outside of a TO-can type package, and a beam which passes through the 45-degree reflective mirror (300), the beam passing through the 45-degree reflective mirror (300) is split into at least two branched beams, a first photodiode (510) is arranged on the path of one branched beam so as to monitor the beam, and wavelength-selective filters (400, 600) having variable transmittance according to the wavelengths and a second photodiode (520) are further arranged on the path of the other branched beam.
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