Proximity detection apparatus and associated methods having single photon avalanche diodes for determining a quality metric based upon the number of events
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United States of America Patent
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Apr 19, 2016
Grant Date -
Apr 3, 2014
app pub date -
Dec 9, 2013
filing date -
Nov 30, 2010
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Abstract
A proximity detector may include an array of single photon avalanche diodes (SPADs) and an illumination source. Illumination from the illumination source may be reflected by a target to the array of single photon avalanche diodes. The SPADs may be operable to detect events. A number of events detected may be dependent on a level of illumination incident on the SPADs. The proximity detector may then determine a quality metric and calculate an output when the quality metric is at a predetermined level. A related method may include regulating the quality of the data on which such a proximity detector apparatus calculates its output.
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