Apparatus and method for acquiring data of fast fail memory
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United States of America Patent
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Apr 12, 2016
Grant Date -
Feb 5, 2015
app pub date -
Jul 30, 2014
filing date -
Jul 31, 2013
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Abstract
An apparatus and method for acquiring data of fast fail memory includes a pattern generator for generating a pattern to be recorded to a device under test (DUT) and receiving DUT data from the DUT; a data transmitter for sending the DUT data and the pattern generated so as to correspond thereto to a failure analyzer from the pattern generator; and a failure analyzer for analyzing the DUT data and the pattern generated so as to correspond to the DUT data, which are received from the data transmitter, thus producing failure analysis information. The data transmitter (FIFO) able to advance the failure analysis time allows failure analysis to be performed before completion of testing, thereby shortening the total failure analysis time and overcoming hardware limitations for failure analysis.
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