Method of identifying materials from multi-energy X-rays
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United States of America Patent
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Apr 12, 2016
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May 2, 2013
app pub date -
Jun 28, 2011
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Jun 29, 2010
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Abstract
A calibration method for a device for identifying materials using X-rays, including: a) determining at least one calibration material and, for each calibration material, at least one calibration thickness of this material, b) measuring, for each of the calibration materials and for each of the selected calibration thicknesses, attenuation or transmission coefficients for X radiation, c) calculating statistical parameters from the coefficients, d) determining or calculating, for each calibration material and for each calibration thickness, a presence probability distribution law, as a function of the statistical parameters.
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