Real time radiation monitoring using nanotechnology
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United States of America Patent
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Mar 29, 2016
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app pub date -
Mar 11, 2014
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Mar 11, 2014
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Abstract
System and method for monitoring receipt and estimating flux value, in real time, of incident radiation, using two or more nanostructures (NSs) and associated terminals to provide closed electrical paths and to measure one or more electrical property change values ΔEPV, associated with irradiated NSs, during a sequence of irradiation time intervals. Effects of irradiation, without healing and with healing, of the NSs, are separately modeled for first order and second order healing. Change values ΔEPV are related to flux, to cumulative dose received by NSs, and to radiation and healing effectivity parameters and/or μ, associated with the NS material and to the flux. Flux and/or dose are estimated in real time, based on EPV change values, using measured ΔEPV values. Threshold dose for specified changes of biological origin (usually undesired) can be estimated. Effects of time-dependent radiation flux are analyzed in pre-healing and healing regimes.
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