Stressed semiconductor detector with piezoelectrical component
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United States of America Patent
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Mar 22, 2016
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Jul 9, 2015
app pub date -
Aug 14, 2013
filing date -
Aug 15, 2012
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Abstract
A semiconductor detector device comprising: a detector element comprising at least one active detector layer of piezoelectric semiconductor material; a stress inducing element arranged to act in use on the detector element to generate therein a predetermined pattern of stress, and consequently a predetermined electrical field via the piezoelectric effect. A method of fabrication and of operation of a semiconductor detector device embodying these principles are also described.
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