Contactless measuring system for contactless decoupling of a signal running on a signal waveguide
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United States of America Patent
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Mar 22, 2016
Grant Date -
Oct 9, 2014
app pub date -
Jun 19, 2014
filing date -
Aug 3, 2007
priority date (Note) -
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Abstract
A contactless measuring system having at least one test probe forming part of a coupling structure for the contactless decoupling of a signal running on a signal waveguide, wherein the signal waveguide is designed as a conductor of the electric circuit on a circuit board and as part of an electric circuit. To this end, at least one contact structure is configured and disposed on the circuit board such that said contact structure is galvanically separated from the signal waveguide, forms part of the coupling structure, is displaced completely within the near field of the signal waveguide, and has at least one contact point, which may be electrically contacted by a contact of the test probe.
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