Test apparatus
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United States of America Patent
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Mar 8, 2016
Grant Date -
Feb 26, 2015
app pub date -
Aug 22, 2014
filing date -
Aug 22, 2013
priority date (Note) -
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status (Latency Note)
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Abstract
Disclosed is a test apparatus including: test target sections each having a connector to connect a Device Under the Test (DUT); measuring sections that include measuring devices that have same measuring item respectively; a switch section that switches connection between the test target section and the measuring section under direction of a controller; wherein the controller selects one of the algorithms of connection, 1) searching vacancy of the measuring sections and directs the switch section to make a path between the test target section and the measuring section of vacancy, 2) holding the path that former selected.
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