Sample fixing member for atomic force microscope

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United States of America Patent

PATENT NO 9279828
APP PUB NO 20150013036A1
SERIAL NO

14374733

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Abstract

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Provided is a sample fixing member for an atomic force microscope capable of reducing the drift amount of a sample during measurement. A sample fixing member for an atomic force microscope of the present invention includes a fibrous columnar structure including a plurality of fibrous columnar objects each having a length of 200 μm or more.

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Patent Owner(s)

Patent OwnerAddress
NITTO DENKO CORPORATION1-2 SHIMO-HOZUMI 1-CHOME IBARAKI-SHI OSAKA 567-8680

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maeno, Youhei Ibaraki, JP 20 103
Suzuki, Yoshinori Ibaraki, JP 250 3043

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