System and method of measurement frequency shifting to isolate external environmental conditions for interferometric dispersion measurements
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United States of America Patent
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Mar 8, 2016
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app pub date -
Mar 14, 2014
filing date -
Mar 15, 2013
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Abstract
A system and method including a semiconductor laser source configured to output radiation over a range of wavelengths at a prescribed rate to a device under test. The prescribed rate is sufficiently above environmental frequency bands. A detector is configured to detect output radiation from the device under test to obtain a detected signal associated with at least one physical property associated with the incident radiation over the range of wavelengths at the prescribed rate. The detected signal includes environmental signal and target signal from the device under test. A processor isolates the environmental signal from the detected signal; and processes the target signal to obtain dispersion information of the device under test. A system output is configured to output the dispersion information of the device under test.
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