Quantum-size-controlled photoelectrochemical etching of semiconductor nanostructures

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United States of America Patent

PATENT NO 9276382
SERIAL NO

14624074

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Quantum-size-controlled photoelectrochemical (QSC-PEC) etching provides a new route to the precision fabrication of epitaxial semiconductor nanostructures in the sub-10-nm size regime. For example, quantum dots (QDs) can be QSC-PEC-etched from epitaxial InGaN thin films using narrowband laser photoexcitation, and the QD sizes (and hence bandgaps and photoluminescence wavelengths) are determined by the photoexcitation wavelength.

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NATIONAL TECHNOLOGY & ENGINEERING SOLUTIONS OF SANDIA LLCP O BOX 5800 MS-0161 ALBUQUERQUE NM 87185

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fischer, Arthur J Albuquerque, US 8 92
Tsao, Jeffrey Y Albuquerque, US 7 189
Wang, George T Albuquerque, US 15 59
Wierer,, Jr Jonathan J Albuquerque, US 20 184
Xiao, Xiaoyin Albuquerque, US 5 26

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