Pyrometer process temperature measurement for high power light sources
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United States of America Patent
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Feb 16, 2016
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app pub date -
Aug 27, 2012
filing date -
Aug 27, 2012
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Abstract
A process measurement system for measuring a parameter of a work surface includes a light source configured to provide a material processing beam, an optical delivery system optically coupled to the light source and configured to homogenize and direct the material processing beam to the work surface, the optical delivery system including a process optic for optically coupling the material processing beam to the work surface in a predetermined way, the optical delivery system including a delivery waveguide having an output face optically coupled to the process optic, and an optical pyrometer in optical communication with the optical delivery system and configured to receive a pyrometer signal emitted from the work surface and coupled into said output face.
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