Method and device for controlling a scanning probe microscope
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United States of America Patent
Stats
-
Jan 26, 2016
Grant Date -
Nov 13, 2014
app pub date -
Dec 12, 2012
filing date -
Dec 12, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The present invention relates to a method for controlling a scanning probe microscope having a probe (2) with a tip (21) for interacting with a sample (4), and a nanoscanner (1) for retaining the sample (4) or the probe (2), comprising the steps of monitoring the extension of the piezo element (1) along a first direction (R) along which the tip (21) is moved towards the sample (4), and adjusting the level of the probe (2) along the first direction (R) by means of an additional actuator (3), when the nanoscanner (1) exhibits an extension below or above a threshold value. The invention further relates to a device (100) for controlling a scanning probe microscope.
First Claim
Other Claims data not available
Family
International Classification(s)
- 2012 Application Filing Year
- B82Y Class
- 2307 Applications Filed
- 1243 Patents Issued To-Date
- 53.88 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 2 Citation Count
- B82Y Class
- 0 % this patent is cited more than
- 9 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jul 26, 2027 |
