Method and instrument for identifying jewelry with plated element using x-ray florescence
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United States of America Patent
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Jan 26, 2016
Grant Date -
Dec 5, 2013
app pub date -
May 31, 2013
filing date -
May 31, 2012
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Abstract
The method uses an XRF instrument for identifying a specified element on a jewelry sample by illuminating its surface with excitation radiation and measuring first and second intensities of characteristic emission lines of a specified element and calculating the ratio between the intensities to establish a measured thickness and to determine based on a certain range criteria whether the sample can be considered to be plated jewelry.
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