Apparatus and method for conducting and real-time application of EC probe calibration
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United States of America Patent
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Jan 26, 2016
Grant Date -
Oct 1, 2015
app pub date -
Mar 27, 2014
filing date -
Mar 27, 2014
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Abstract
A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.
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