Terahertz scanning reflectometer
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United States of America Patent
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Jan 19, 2016
Grant Date -
Apr 17, 2014
app pub date -
Dec 30, 2013
filing date -
Oct 15, 2003
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Abstract
A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
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