Perpendicular spin torque oscillator FMR frequency measurement method

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United States of America Patent

PATENT NO 9222994
APP PUB NO 20130069626A1
SERIAL NO

13200148

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Abstract

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A method for measuring the frequency in a spin torque oscillator having at least a magnetic oscillation layer (MOL), junction layer, and magnetic reference layer (MRL) is disclosed. In a first embodiment, a small in-plane magnetic field is applied to the STO after a DC current is applied to excite the MOL into an oscillation state. The MRL has a perpendicular magnetization that is tilted slightly to give an in-plane magnetization component to serve as a reference layer for measuring the oscillation frequency of the MOL in-plane magnetization component. An AC voltage change is produced in the DC current as a result of variable STO resistance and directly correlates to MOL oscillation frequency. Alternatively, a field having both perpendicular and in-plane components may be applied externally or by forming the STO between two magnetic poles thereby producing an in-plane magnetization reference component in the MRL.

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Patent Owner(s)

Patent OwnerAddress
TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION1-1 SHIBAURA 1-CHOME MINATO-KU TOKYO 105-0023

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Dovek, Moris San Jose, US 102 1722
Funayama, Tomomi Fuchu, JP 87 2354
Li, Min Fremont, US 751 7676
Smyth, Joe Aptos, US 50 1093
Takagishi, Masayuki Kunitachi, JP 183 3507
Takano, Kenichi Saku, JP 83 869
Takashita, Masahiro Kawasaki, JP 53 1963
Takeo, Akihiko Kunitachi, JP 90 1154
Zhang, Kunliang Fremont, US 146 3314
Zhou, Yuchen San Jose, US 222 4833

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