Method of measuring luminescence of a material
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United States of America Patent
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Dec 15, 2015
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N/A
app pub date -
Apr 18, 2012
filing date -
Jun 8, 2011
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Abstract
A method of measuring luminescence of a material is disclosed. The method includes applying a light source to excite an exposed material. The method also includes amplifying an emission signal of the material. The method further includes measuring a luminescent emission at a fixed time window of about 10 picoseconds to about 10 nanoseconds. The luminescence may be radio photoluminescence (RPL) or optically stimulated luminescence (OSL).
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